Logo

Educated Owl Books
Help Login / SignUp (0)
Sell with us!
Machine Learning Support for Fault Diagnosis of System-on-Chip

Machine Learning Support for Fault Diagnosis of System-on-Chip

by Patrick Girard, Shawn Blanton, Li-C. Wang Hardcover 2023

⭐ 0.0 rating
⭐ 0.0 out of 5 0 global ratings
5 star
65%
4 star
20%
3 star
10%
2 star
3%
1 star
2%
| 📖 0 saved | ✅ 0 verified
  • Author: Patrick Girard, Shawn Blanton, Li-C. Wang
  • ISBN 13: 9783031196386
  • ISBN 10: 3031196384
  • Publication Year: 2023
  • Language: English

Specifications

Index-103031196384
LanguageEnglish
Index-139783031196386
Period-
Class Track-
Publisher- (2023)
Pages-

✨ Readers also enjoyed...

View All →
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs : …

Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

Inquire
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs : …

Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

Inquire
Dynamic Formal Epistemology

Dynamic Formal Epistemology

Patrick Girard, Olivier Roy, Mathieu Marion

Inquire
Dynamic Formal Epistemology

Dynamic Formal Epistemology

Patrick Girard, Olivier Roy, Mathieu Marion

Inquire
Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strat…

Patrick Girard, Nicola Nicolici, Xiaoqing Wen

Inquire