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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel Hardcover 2009

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  • Author: Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel
  • ISBN 13: 9781441909374
  • ISBN 10: 1441909370
  • Publication Year: 2009
  • Language: English

Specifications

Index-101441909370
LanguageEnglish
Index-139781441909374
Period-
Class Track-
Publisher- (2009)
Pages-

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