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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel Paperback 2014

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  • Author: Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
  • ISBN 13: 9781489983145
  • ISBN 10: 1489983147
  • Publication Year: 2014
  • Language: English

Specifications

Index-101489983147
LanguageEnglish
Index-139781489983145
Period-
Class Track-
Publisher- (2014)
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