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Nanometer-Scale Defect Detection Using Polarized Light

Nanometer-Scale Defect Detection Using Polarized Light

by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami Hardcover 1

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  • Author: Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
  • ISBN 13: 9781848219366
  • ISBN 10: 1848219369
  • Publication Year: 1
  • Language: English

Specifications

Index-10 1848219369
Index-13 9781848219366
Language English

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