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Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties

Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties

by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami Hardcover 2021

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  • Author: Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
  • ISBN 13: 9781786306401
  • ISBN 10: 1786306409
  • Publication Year: 2021
  • Language: English

Specifications

Index-10 1786306409
Index-13 9781786306401
Language English

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