Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Scaling Effects on Metal-oxide-semiconductor Device Characteristics

by Steven Walstra Hardcover 2019

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  • Author: Steven Walstra
  • ISBN 13: 9780530002330
  • ISBN 10: 0530002337
  • Publication Year: 2019
  • Language: English

Specifications

Index-10 0530002337
Index-13 9780530002330
Language English