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Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Scaling Effects on Metal-oxide-semiconductor Device Characteristics

by Steven Walstra Paperback 2019

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  • Author: Steven Walstra
  • ISBN 13: 9780530002323
  • ISBN 10: 0530002329
  • Publication Year: 2019
  • Language: English

Specifications

Index-100530002329
LanguageEnglish
Index-139780530002323
Period-
Class Track-
Publisher- (2019)
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