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X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4 1987

X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4 1987

by David Sayre, Malcolm Howells, Janos Kirz, Harvey Rarback Paperback 2013

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Author: David Sayre, Malcolm Howells, Janos Kirz, Harvey Rarback
ISBN 13: 9783662144909
ISBN 10: 3662144905
Publication Year: 2013
Language: English

Specifications

Index-103662144905

LanguageEnglish

Index-139783662144909

Period-

Class Track-

Publisher- (2013)

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