Point Defects in Semiconductors II : Experimental Aspects

Point Defects in Semiconductors II : Experimental Aspects

by J. Bourgoin Paperback 2011

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  • Author: J. Bourgoin
  • ISBN 13: 9783642818349
  • ISBN 10: 364281834X
  • Publication Year: 2011
  • Language: English

Specifications

Index-10364281834X
LanguageEnglish
Index-139783642818349
Period-
Class Track-
Publisher- (2011)
Pages-