The Effect of Nuclear Reactions on Integrated Circuit Reliability

The Effect of Nuclear Reactions on Integrated Circuit Reliability

by Nathaniel Dodds Paperback 2010

⭐ 0.0 rating
⭐ 0.0 out of 5 0 global ratings
5 star
65%
4 star
20%
3 star
10%
2 star
3%
1 star
2%
| 📖 0 saved | ✅ 0 verified
  • Author: Nathaniel Dodds
  • ISBN 13: 9783639241280
  • ISBN 10: 3639241282
  • Publication Year: 2010
  • Language: English

Specifications

Index-10 3639241282
Index-13 9783639241280
Language English