Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2,

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Author: Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson
ISBN 13: 9783319490540
ISBN 10: 3319490540
Publication Year: 2016
Language: English

Index-103319490540

LanguageEnglish

Index-139783319490540

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Publisher- (2016)

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