Logo

Educated Owl Books
Help Login / SignUp (0)
Sell with us!
Hf-Based High-K Dielectrics : Process Development, Performance Characterization, and Reliability

Hf-Based High-K Dielectrics : Process Development, Performance Characterization, and Reliability

by Jack C. Lee, Young-Hee Kim Paperback 2007

⭐ 0.0 rating
⭐ 0.0 out of 5 0 global ratings
5 star
65%
4 star
20%
3 star
10%
2 star
3%
1 star
2%
| 📖 0 saved | ✅ 0 verified
  • Author: Jack C. Lee, Young-Hee Kim
  • ISBN 13: 9783031014246
  • ISBN 10: 3031014243
  • Publication Year: 2007
  • Language: English

Specifications

Index-10 3031014243
Index-13 9783031014246
Language English

✨ Readers also enjoyed...

View All →
Modelling and Prediction Honoring Seymour Geisser

Modelling and Prediction Honoring …

Jack C. Lee, Wesley O. Johnson, Arnold Zellner

Inquire
World Mythology : An Anthology of Great Myths and Epics

World Mythology : An Anthology of …

Donna G. Rosenberg

Inquire