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Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization

Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization

by Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun Hardcover 2019

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  • Author: Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun
  • ISBN 13: 9783030261719
  • ISBN 10: 3030261719
  • Publication Year: 2019
  • Language: English

Specifications

Index-103030261719
LanguageEnglish
Index-139783030261719
Period-
Class Track-
Publisher- (2019)
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