An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science
by Sarah Fearn Hardcover 2015
- Author: Sarah Fearn
- ISBN 13: 9781643279107
- ISBN 10: 1643279106
- Publication Year: 2015
- Language: English
Specifications
Index-101643279106
LanguageEnglish
Index-139781643279107
Period-
Class Track-
Publisher- (2015)
Pages-
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