Reliability of Microtechnology : Interconnects, Devices and Systems

Reliability of Microtechnology : Interconnects, Devices and Systems

by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall Paperback 2014

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  • Author: Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall
  • ISBN 13: 9781489982117
  • ISBN 10: 1489982116
  • Publication Year: 2014
  • Language: English

Specifications

Index-10 1489982116
Index-13 9781489982117
Language English