Hierarchical Modeling for VLSI Circuit Testing
by Debashis Bhattacharya, John P. Hayes Paperback 2011
- Author: Debashis Bhattacharya, John P. Hayes
- ISBN 13: 9781461288190
- ISBN 10: 1461288193
- Publication Year: 2011
- Language: English
Specifications
| Index-10 | 1461288193 |
|---|---|
| Index-13 | 9781461288190 |
| Language | English |
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