From Contamination to Defects, Faults and Yield Loss : Simulation and Applications

From Contamination to Defects, Faults and Yield Loss : Simulation and Applications

by Jitendra B. Khare, Wojciech Maly Paperback 2011

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  • Author: Jitendra B. Khare, Wojciech Maly
  • ISBN 13: 9781461285953
  • ISBN 10: 146128595X
  • Publication Year: 2011
  • Language: English

Specifications

Index-10 146128595X
Index-13 9781461285953
Language English