Atomic Scale Characterization and First-Principles Studies of SiN Interfaces
by Weronika Walkosz Hardcover 2011
- Author: Weronika Walkosz
- ISBN 13: 9781441978165
- ISBN 10: 144197816X
- Publication Year: 2011
- Language: English
Specifications
| Index-10 | 144197816X |
|---|---|
| Index-13 | 9781441978165 |
| Language | English |