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Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents

by Adam Foster, Werner A. Hofer Paperback 2010

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  • Author: Adam Foster, Werner A. Hofer
  • ISBN 13: 9781441923066
  • ISBN 10: 1441923063
  • Publication Year: 2010
  • Language: English

Specifications

Index-101441923063
LanguageEnglish
Index-139781441923066
Period-
Class Track-
Publisher- (2010)
Pages-

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