Logo

Educated Owl Books
Help Login / SignUp (0)
Sell with us!
Materials Reliability in Microelectronics III

Materials Reliability in Microelectronics III

by Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho Paperback 2014

⭐ 0.0 rating
⭐ 0.0 out of 5 0 global ratings
5 star
65%
4 star
20%
3 star
10%
2 star
3%
1 star
2%
| 📖 0 saved | ✅ 0 verified
  • Author: Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho
  • ISBN 13: 9781107409484
  • ISBN 10: 1107409489
  • Publication Year: 2014
  • Language: English

Specifications

Index-10 1107409489
Index-13 9781107409484
Language English

✨ Readers also enjoyed...

View All →
Authorship and Cultural Identity in Early Greece and China : Patterns of Literary Circulation

Authorship and Cultural Identity i…

Alexander Beecroft

Inquire