Electromigration in Metals : Fundamentals to Nano-Interconnects
by Paul Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev Hardcover 2022
- Author: Paul Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev
- ISBN 13: 9781107032385
- ISBN 10: 1107032385
- Publication Year: 2022
- Language: English
Specifications
| Index-10 | 1107032385 |
|---|---|
| Index-13 | 9781107032385 |
| Language | English |
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