High Resolution X-Ray Diffractometry and Topography
by D. K. Bowen, Brian K. Tanner Hardcover 1998
- Author: D. K. Bowen, Brian K. Tanner
- ISBN 13: 9780850667585
- ISBN 10: 0850667585
- Publication Year: 1998
- Language: English
Specifications
Index-100850667585
LanguageEnglish
Index-139780850667585
Period-
Class Track-
Publisher- (1998)
Pages-
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