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Hot-Carrier Reliability of MOS VLSI Circuits

Hot-Carrier Reliability of MOS VLSI Circuits

by Yusuf Leblebici, Sung-Mo Kang Hardcover 2003

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  • Author: Yusuf Leblebici, Sung-Mo Kang
  • ISBN 13: 9780792393528
  • ISBN 10: 079239352X
  • Publication Year: 2003
  • Language: English

Specifications

Index-10079239352X
LanguageEnglish
Index-139780792393528
Period-
Class Track-
Publisher- (2003)
Pages-

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