Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

by David H. Krinsley, Kenneth Pye, N. Keith Tovey, Sam Boggs Hardcover 1998

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  • Author: David H. Krinsley, Kenneth Pye, N. Keith Tovey, Sam Boggs
  • ISBN 13: 9780521453462
  • ISBN 10: 0521453461
  • Publication Year: 1998
  • Language: English

Specifications

Index-100521453461
LanguageEnglish
Index-139780521453462
Period-
Class Track-
Publisher- (1998)
Pages-