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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein Hardcover 1986

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  • Author: Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein
  • ISBN 13: 9780306421402
  • ISBN 10: 0306421402
  • Publication Year: 1986
  • Language: English

Specifications

Index-10 0306421402
Index-13 9780306421402
Language English

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